Publication Details

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Department

Electrical Engineering & Computer Science

Department

Electrical Engineering & Computer Science

Authors

Kapil Jainwal

Mukul Sarkar

Kushal Shah

Title of Article

Analysis and validation of low-frequency noise reduction in MOSFET circuits using variable duty cycle switched biasing

Title of journal

IEEE Journal of the Electron Devices Society

Year

2018

Volume

DOI

Pages

TBA --

Keywords

1/f noise; Noise modelling;

Status

Active

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